Standard Svensk standard · SS-EN 15991:2011

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Status: Upphävd

· Ersätts av: SS-EN 15991:2015
Köp denna standard

Standard Svensk standard · SS-EN 15991:2011

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
Prenumerera på standarden - Läs mer Dölj
Pris: 1 152 SEK
standard ikon pdf

PDF

Pris: 1 152 SEK
standard ikon

Papper

Fler alternativ Färre alternativ
Provläs denna standard
Omfattning
This European Standard defines a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide. Dependent on element, wavelength, plasma conditions and weight, this test method is applicable for mass contents of the above trace contaminations from about 0,1 mg/kg to about 1 000 mg/kg, after evaluation also from 0,001 mg/kg to about 5 000 mg/kg. NOTE 1 Generally for optical emission spectrometry using inductively coupled plasma (ICP OES) and electrothermal vaporisation (ETV) there is a linear working range of up to four orders of magnitude. This range can be expanded for the respective elements by variation of the weight or by choosing lines with different sensitivity. After adequate verification, the standard is also applicable to further metallic elements (excepting Rb and Cs) and some non-metallic contaminations (like P and S) and other allied non-metallic powdered or granular materials like carbides, nitrides, graphite, soot, coke, coal, and some other oxidic materials (see [1], [4], [5], [6], [7], [8], [9] and [10]). NOTE 2 There is positive experience with materials like for example graphite, B4C, Si3N4, BN and several metal oxides as well as with the determination of P and S in some of these materials.

Ämnesområden

Råmaterial (81.060.10)


Köp denna standard

Standard Svensk standard · SS-EN 15991:2011

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
Prenumerera på standarden - Läs mer Dölj
Pris: 1 152 SEK
standard ikon pdf

PDF

Pris: 1 152 SEK
standard ikon

Papper

Fler alternativ Färre alternativ

Produktinformation

Språk: Engelska

Framtagen av: Standardiseringsarbete utan svenskt deltagande, SIS/TK 998

Internationell titel: Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Artikelnummer: STD-76479

Utgåva: 1

Fastställd: 2011-02-09

Antal sidor: 36

Ersätts av: SS-EN 15991:2015